Nanoscale Metrology

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Selected contributions from the Nanoscale 2006 seminar now online - 17 Jan 2007

Non-profit scientific publisher Institute of Physics Publishing (IOP), UK,http://journals.iop.org/ has announced that selected contributions from the Nanoscale 2006 seminar held at the Swiss Federal Office of Metrology (METAS) in April 2006 are now available online in Nanoscale Metrology. Nanoscale Metrology is a special issue published in the February issue of Measurement Science and Technology.

Contributions in this special issue are divided into three parts - developments and improvements of instrumentation and measurement methods; calibration of instruments and standards; and applications. The articles will be freely available until February 10, 2007.

A monthly publication, Measurement Science and Technology covers the theory, practice and application of measurement in physics, chemistry, engineering and the environmental and life sciences from inception to commercial exploitation.

Click herehttp://www.iop.org/EJ/news/-topic=1199/ to read the original press release.

Measurement science & technology is retained in print format by Fine Hall Library. Princeton also has an electronic subscription.

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This page contains a single entry by Louise F. Deis published on January 17, 2007 11:07 AM.

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